Canadian Measurement and Metrology is hosting their Knowledge Tour 2013 event today at the firms Mississauga, ontario headquarters.
The invitation-only event is full, with over 80 attendees taking part in multiple seminars on a wide variety of advanced measuring technologies.
The morning session is a PC-DMIS user forum presented by senior application engineer Grant Sewell, which will be followed by sessions on multi-sensor measurement, shop floor metrology with Leica and Romer equipment and a scanning face off between white light and laser technologies.
Lunch will be served, after which networking and prizes which include a gift card for Lionhead Golf and Country Club and iPod Shuffles.
